Integration of material information and mechanical properties with geometry enables many product development activities, including design, analysis, and manufacturing. To integrate material information into CAD systems, geometric features of material microstructure must be recognized and represented, which is the focus of this paper. Linear microstructure features, such as fibers or grain boundaries, can be found computationally from microstructure images using surfacelet based methods, which include the Radon or Radon-like transform followed by a wavelet transform. By finding peaks in the transform results, linear features can be recognized and characterized by length, orientation, and position. The challenge is that often a feature will be imprecisely represented in the transformed parameter space. In this paper, we investigate several variations of the surfacelet based feature recognition methods, including masks, clustering methods, and whether to recognize features in the Radon or wavelet transform. These variations will be investigated to identify their strengths and limitations on a metal alloy and reinforced polymer microstructures.
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ASME 2013 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
August 4–7, 2013
Portland, Oregon, USA
Conference Sponsors:
- Design Engineering Division
- Computers and Information in Engineering Division
ISBN:
978-0-7918-5585-0
PROCEEDINGS PAPER
A Comparison of Surfacelet-Based Methods for Recognizing Linear Geometric Features in Material Microstructure
Namin Jeong,
Namin Jeong
Georgia Institute of Technology, Atlanta, GA
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David W. Rosen,
David W. Rosen
Georgia Institute of Technology, Atlanta, GA
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Yan Wang
Yan Wang
Georgia Institute of Technology, Atlanta, GA
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Namin Jeong
Georgia Institute of Technology, Atlanta, GA
David W. Rosen
Georgia Institute of Technology, Atlanta, GA
Yan Wang
Georgia Institute of Technology, Atlanta, GA
Paper No:
DETC2013-13370, V02AT02A027; 10 pages
Published Online:
February 12, 2014
Citation
Jeong, N, Rosen, DW, & Wang, Y. "A Comparison of Surfacelet-Based Methods for Recognizing Linear Geometric Features in Material Microstructure." Proceedings of the ASME 2013 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. Volume 2A: 33rd Computers and Information in Engineering Conference. Portland, Oregon, USA. August 4–7, 2013. V02AT02A027. ASME. https://doi.org/10.1115/DETC2013-13370
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