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1-20 of 67
5th International Conference on Micro- and Nanosystems
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Proceedings Papers
Vijay Kumar, J. William Boley, Yushi Yang, Hendrik Ekowaluyo, Jacob K. Miller, George T.-C. Chiu, Jeffrey F. Rhoads
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 177-186, August 28–31, 2011
Paper No: DETC2011-48199
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 41-49, August 28–31, 2011
Paper No: DETC2011-47653
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 263-267, August 28–31, 2011
Paper No: DETC2011-48888
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 101-106, August 28–31, 2011
Paper No: DETC2011-47271
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 335-344, August 28–31, 2011
Paper No: DETC2011-47914
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 79-85, August 28–31, 2011
Paper No: DETC2011-47125
Proceedings Papers
Kleber dos Santos Rodrigues, Jose´ Manoel Balthazar, Angelo Marcelo Tusset, Bento Rodrigues Pontes Ju´nior
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 491-500, August 28–31, 2011
Paper No: DETC2011-47543
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 187-190, August 28–31, 2011
Paper No: DETC2011-48286
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 413-416, August 28–31, 2011
Paper No: DETC2011-48999
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 107-116, August 28–31, 2011
Paper No: DETC2011-47289
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 269-277, August 28–31, 2011
Paper No: DETC2011-47512
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 345-354, August 28–31, 2011
Paper No: DETC2011-48810
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 501-506, August 28–31, 2011
Paper No: DETC2011-47668
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 191-196, August 28–31, 2011
Paper No: DETC2011-48373
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 11-15, August 28–31, 2011
Paper No: DETC2011-47178
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 417-424, August 28–31, 2011
Paper No: DETC2011-47298
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 279-286, August 28–31, 2011
Paper No: DETC2011-47902
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 355-364, August 28–31, 2011
Paper No: DETC2011-48842
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 507-524, August 28–31, 2011
Paper No: DETC2011-47730
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 117-123, August 28–31, 2011
Paper No: DETC2011-47461