Accelerated Thermal Cycling (ATC) is traditionally used for assessing solder joint reliability. ATC typically takes as long as three to four months to complete. This paper proposes a new method to determine the fatigue life of solder joints using laser moire´ technique. The developed method takes about a week to complete and gives us the detailed deformation behavior of each solder ball in the package at various temperatures. The developed method has been demonstrated for a high I/O organic BGA package. To illustrate the efficacy of the method, the results have been validated using experimental thermal cycling data.
Volume Subject Area:
Electronic and Photonic Packaging
1.
Han
B.
Guo
Y.
Thermal Deformation Analysis of Various Electronic Packaging Products by Moire and Microscopic Moire Interferometry
. Journal of Electronic Packaging
, 1995
. 117
: p. 185
–189
.2.
Dai
F.
McKelvie
J.
Post
D.
An Interpolation of Moire Interferometry from Wavefront Interference Theory
. Optics and Lasers in Engineering
, 1990
. 12
: p. 101
–118
.3.
Engelmaier
W.
Fatigue Life of Leadless Chip Carrier Solder Joints During Power Cycling
. IEEE Transactions on Components, Packaging, and Manufacturing Technology
, IEEE, vol. CHMT-6, No.3, pp. 52–57, 1983
. 3
: p. 52
–57
.4.
Modi, M., C. McCormick, and N. Armendariz, New insights in critical solder joint location. ECTC 2005, 2005. 1: p. 977–982.
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