This paper investigates how corrosion growth that originates from shallow film voids on thin film sputtered magnetic media can impact the final HDD system performance. The impact of shallow void corrosion [1] in HDD system can be both on its behavior during initialization i.e. servo write formatting and initial defect mapping, and on its long term reliability. One of the main concerns for HDD reliability due to media is the occurrence of a condition called metallic smear. Metallic smear is a contamination of the head-pole area that causes an unstable fly height condition. Metallic smear is possibly caused by media corrosion and therefore void corrosion is a logical concern. However, our study shows that shallow void corrosion is not associated with metallic smear risk and does not contribute to HDD initialization failures.
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ASME-JSME 2018 Joint International Conference on Information Storage and Processing Systems and Micromechatronics for Information and Precision Equipment
August 29–30, 2018
San Francisco, California, USA
Conference Sponsors:
- Information Storage and Processing Systems Division
ISBN:
978-0-7918-5193-7
PROCEEDINGS PAPER
Impact of Shallow Void Corrosion on HDD Initialization Failures
Abhishek Srivastava,
Abhishek Srivastava
Western Digital Corporation, San Jose, CA
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Tom O’Dell,
Tom O’Dell
Western Digital Corporation, San Jose, CA
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Istvan Boszormenyi
Istvan Boszormenyi
Western Digital Corporation, San Jose, CA
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Abhishek Srivastava
Western Digital Corporation, San Jose, CA
Tom O’Dell
Western Digital Corporation, San Jose, CA
Istvan Boszormenyi
Western Digital Corporation, San Jose, CA
Paper No:
ISPS-MIPE2018-8583, V001T01A009; 4 pages
Published Online:
November 14, 2018
Citation
Srivastava, A, O’Dell, T, & Boszormenyi, I. "Impact of Shallow Void Corrosion on HDD Initialization Failures." Proceedings of the ASME-JSME 2018 Joint International Conference on Information Storage and Processing Systems and Micromechatronics for Information and Precision Equipment. ASME-JSME 2018 Joint International Conference on Information Storage and Processing Systems and Micromechatronics for Information and Precision Equipment. San Francisco, California, USA. August 29–30, 2018. V001T01A009. ASME. https://doi.org/10.1115/ISPS-MIPE2018-8583
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