Maskless nanolithography is an agile and cost effective approach if their throughputs can be scaled for mass production purposes. Using plasmonic nanolithography (PNL) approach, direct pattern writing was successfully demonstrated with around 20 nm half-pitch at high speed. Here, we report our recent efforts of implementing a high-throughput PNL prototype system with unique metrology and control features, which are designed to use an array of plasmonic lenses to pattern sub-100 nm features on a rotating substrate. Taking the advantage of air bearing surface techniques, the system can expose the wafer pixel by pixel with a speed of ∼10 m/s, much faster than any conventional scanning based lithography system. It is a low-cost, high-throughput maskless approach for the next generation lithography and also for the emerging nanotechnology applications, such as nanoscale metrology and imaging.
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ASME 2016 11th International Manufacturing Science and Engineering Conference
June 27–July 1, 2016
Blacksburg, Virginia, USA
Conference Sponsors:
- Manufacturing Engineering Division
ISBN:
978-0-7918-4989-7
PROCEEDINGS PAPER
Scalable Plasmonic Nanolithography: Prototype System Design and Construction
Yuan Wang,
Yuan Wang
University of California, Berkeley, Berkeley, CA
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Mohamed E. Saad,
Mohamed E. Saad
The University of North Carolina at Charlotte, Charlotte, NC
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Kang Ni,
Kang Ni
The University of North Carolina at Charlotte, Charlotte, NC
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Yen Chi Chang,
Yen Chi Chang
University of California, Los Angeles, CA
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Cheng-Wei Chen,
Cheng-Wei Chen
University of California, Los Angeles, CA
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Chen Chen,
Chen Chen
Purdue University, West Lafayette, IN
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Liang Pan,
Liang Pan
Purdue University, West Lafayette, IN
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Tsu Chin Tsao,
Tsu Chin Tsao
University of California, Los Angeles, CA
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Adrienne S. Lavine,
Adrienne S. Lavine
University of California, Los Angeles, CA
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David B. Bogy,
David B. Bogy
University of California, Berkeley, Berkeley, CA
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Xiang Zhang
Xiang Zhang
University of California, Berkeley, Berkeley, CA
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Yuan Wang
University of California, Berkeley, Berkeley, CA
Mohamed E. Saad
The University of North Carolina at Charlotte, Charlotte, NC
Kang Ni
The University of North Carolina at Charlotte, Charlotte, NC
Yen Chi Chang
University of California, Los Angeles, CA
Cheng-Wei Chen
University of California, Los Angeles, CA
Chen Chen
Purdue University, West Lafayette, IN
Liang Pan
Purdue University, West Lafayette, IN
Tsu Chin Tsao
University of California, Los Angeles, CA
Adrienne S. Lavine
University of California, Los Angeles, CA
David B. Bogy
University of California, Berkeley, Berkeley, CA
Xiang Zhang
University of California, Berkeley, Berkeley, CA
Paper No:
MSEC2016-8671, V001T02A081; 8 pages
Published Online:
September 27, 2016
Citation
Wang, Y, Saad, ME, Ni, K, Chang, YC, Chen, C, Chen, C, Pan, L, Tsao, TC, Lavine, AS, Bogy, DB, & Zhang, X. "Scalable Plasmonic Nanolithography: Prototype System Design and Construction." Proceedings of the ASME 2016 11th International Manufacturing Science and Engineering Conference. Volume 1: Processing. Blacksburg, Virginia, USA. June 27–July 1, 2016. V001T02A081. ASME. https://doi.org/10.1115/MSEC2016-8671
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