An experiment with solder joints of thin plastic packages, cycled between −10° and 110°C, has demonstrated that the majority of solder joint failures occurred at the low temperatures. In this experiment, the low temperatures caused high peeling stresses in the heel area of solder joints and, as usual, relatively low plastic shear strain (as compared with these strains at high temperatures). This fact suggests that the impact of solder peeling stresses on the solder failure is noticeably higher than is anticipated by applying the commonly used failure criteria.

Issue Section:
Technical Brief
Keywords:
plastic packaging, thermal management (packaging), thermal stress cracking, circuit reliability, soldering
Topics:
Failure, Low temperature, Solder joints, Solders, Stress, Shear (Mechanics), Circuits
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