Most connectors are made from copper or copper alloys, with beryllium copper and phosphor bronze being the most common base materials due to their high electrical conductivity, low stress relaxation, and competitive cost. The most significant drawback is copper’s low resistance to corrosion, which can lead to electrical failure of connectors. For this reason, a layer of gold is often plated on the surfaces of connectors to seal off the base metal from being directly exposed to the environment. As an economical practice, gold flashing has been used to protect electrical contacts from corrosion. However, there is increasing evidence indicating that gold flashing can be detrimental in applications calling for long-term reliability. This paper provides insight into reliability issues of gold flash.
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March 2004
Technical Papers
Why Gold Flash Can Be Detrimental to Long-Term Reliability
Jingsong Xie,
Jingsong Xie
CALCE Electronic Products & Systems Center, University of Maryland, College Park, MD 20742
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Ming Sun,
Ming Sun
CALCE Electronic Products & Systems Center, University of Maryland, College Park, MD 20742
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Michael Pecht,
Michael Pecht
CALCE Electronic Products & Systems Center, University of Maryland, College Park, MD 20742
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David F. Barbe
David F. Barbe
CALCE Electronic Products & Systems Center, University of Maryland, College Park, MD 20742
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Jingsong Xie
CALCE Electronic Products & Systems Center, University of Maryland, College Park, MD 20742
Ming Sun
CALCE Electronic Products & Systems Center, University of Maryland, College Park, MD 20742
Michael Pecht
CALCE Electronic Products & Systems Center, University of Maryland, College Park, MD 20742
David F. Barbe
CALCE Electronic Products & Systems Center, University of Maryland, College Park, MD 20742
Contributed by the Electronic and Photonic Packaging Division for publication in the JOURNAL OF ELECTRONIC PACKAGING. Manuscript received Nov. 2000. Associate Editor: B. Michel.
J. Electron. Packag. Mar 2004, 126(1): 37-40 (4 pages)
Published Online: April 30, 2004
Article history
Received:
November 1, 2000
Online:
April 30, 2004
Citation
Xie , J., Sun , M., Pecht , M., and Barbe , D. F. (April 30, 2004). "Why Gold Flash Can Be Detrimental to Long-Term Reliability ." ASME. J. Electron. Packag. March 2004; 126(1): 37–40. https://doi.org/10.1115/1.1646425
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