3D integration consists of 3D integrated circuit (IC) packaging, 3D Si integration, and 3D IC integration. They are different and in general the through-silicon via (TSV) separates 3D IC packaging from 3D Si/IC integrations since the latter two use TSV but 3D IC packaging does not. 3D Si integration and 3D IC integration are different. 3D IC integration stacks up the thin chips with TSV and microbump, while 3D Si integration stacks up thin wafers with TSV alone (i.e., bumpless). TSV is the heart of 3D Si/IC integrations and is the focus of this investigation. Also, the state-of-the-art, challenge, and trend of 3D integration will be presented and examined. Furthermore, supply chain readiness for high volume manufacturing (HVM) of TSVs is discussed.
Skip Nav Destination
Article navigation
December 2014
Review Articles
Overview and Outlook of Three-Dimensional Integrated Circuit Packaging, Three-Dimensional Si Integration, and Three-Dimensional Integrated Circuit Integration
John H. Lau
John H. Lau
Fellow ASME
ASM Pacific Technology
,16-22 Kung Yip Street
,Kwai Chung, NT
, Hong Kong
Search for other works by this author on:
John H. Lau
Fellow ASME
ASM Pacific Technology
,16-22 Kung Yip Street
,Kwai Chung, NT
, Hong Kong
Contributed by the Electronic and Photonic Packaging Division of ASME for publication in the JOURNAL OF ELECTRONIC PACKAGING. Manuscript received July 27, 2014; final manuscript received September 11, 2014; published online October 15, 2014. Assoc. Editor: Kyoung-sik Moon.
J. Electron. Packag. Dec 2014, 136(4): 040801 (15 pages)
Published Online: October 15, 2014
Article history
Received:
July 27, 2014
Revision Received:
September 11, 2014
Citation
Lau, J. H. (October 15, 2014). "Overview and Outlook of Three-Dimensional Integrated Circuit Packaging, Three-Dimensional Si Integration, and Three-Dimensional Integrated Circuit Integration." ASME. J. Electron. Packag. December 2014; 136(4): 040801. https://doi.org/10.1115/1.4028629
Download citation file:
Get Email Alerts
Anand Model Constants of Sn–Ag–Cu Solders: What Do They Actually Mean?
J. Electron. Packag (June 2025)
Sequential Versus Concurrent Effects in Combined Stress Solder Joint Reliability
J. Electron. Packag (June 2025)
Related Articles
Measurement of Thermal Deformation of Interconnect Layers Using SIEM
J. Electron. Packag (September,2002)
Recent Advances and New Trends in Flip Chip Technology
J. Electron. Packag (September,2016)
Special Issue on InterPACK2022
J. Electron. Packag (December,2023)
Special Section on InterPACK2021
J. Electron. Packag (March,2023)
Related Proceedings Papers
Related Chapters
Wafer Logistics Information System for Integrated Circuit Foundry Supply Chain Management
International Conference on Advanced Computer Theory and Engineering, 4th (ICACTE 2011)
Introduction
Ultrasonic Welding of Lithium-Ion Batteries
Surface Analysis and Tools
Tribology of Mechanical Systems: A Guide to Present and Future Technologies