...R. Kathiravan; Ravi Kumar; Akhilesh Gupta; Ramesh Chandra Copper nanoparticles with an average size of 10 nm are prepared by the sputtering method and are characterized using different techniques, viz., X-ray diffraction spectrum, atomic force microscopy, and transmission electron microscopy...

... force microscopy Thermal and electrical properties of thin films are important for performance and reliability design of future microelectronic and nanoelectronic systems. Electrical connections in these systems consist of metal wiring of size 100 nm or less. When the size of a metal...

... model, which accounts for many important factors, including filler aspect ratio and maximum packing fraction. In this work, the aspect ratio was determined by atomic force microscopy (AFM) and used as an input parameter in the Nielsen model. We obtained good agreement between our results...

... , the cantilever temperature required for bit formation is as high as 500 ° C . By quantifying the conditions required for indent formation, this work may improve the operation of heated probes for thermomechanical data storage. 15 02 2006 15 01 2007 atomic force microscopy elemental...

... 2006 26 05 2006 borosilicate glasses nanostructured materials dielectric materials nanopatterning electron density Fokker-Planck equation laser ablation high-speed optical techniques multiphoton processes photoionisation atomic force microscopy scanning electron microscopy...

...; revision received May 4, 2004. Associate Editor: S. Thynell. 27 January 2004 04 May 2004 26 01 2005 silicon reflectivity atomic force microscopy Gaussian distribution elemental semiconductors rough surfaces surface topography geometrical optics Properties Radiation...

...William P. King; Kenneth E. Goodson 16 07 2002 atomic force microscopy nanostructured materials imaging polymers thermal resistance Journal of Heat Transfer AUGUST 2002, Vol. 124 Õ 597 2002 ASME ...

... and Exhibition in New York last November. Seven entries were selected for publication in this special section of the ASME JOURNAL OF HEAT TRANSFER . heat transfer flow visualisation photography fluorescence stratified flow atomic force microscopy light interferometry infrared imaging 16...

...Tai-Hsi Fan and; Andrei Fedorov atomic force microscopy data visualisation molecular dynamics method digital simulation A computer visualization method is used to present the details of the imaging action by the surface scanning equipment—Atomic Force Microscope (AFM) from...

... Division February 8, 2001; revision received July 27, 2001. Associate Editor: D. Poulikakos. 08 February 2001 27 July 2001 point contacts heat transfer thermal conductivity atomic force microscopy temperature sensors Contact Resistance Heat Transfer Microscale Nanoscale...