This paper presents a new method to embed microthin film sensors into metallic structures by diffusion bonding. The experiments were carried out using AISI 304 stainless steel substrates with a bonding temperature of and a pressure of 4 MPa, which the developed thin film system was able to sustain. The success of embedding was validated by sensor functionality tests and metallurgical characterization. This sensor embedding method can be extended to other engineering metallic materials. To demonstrate the applications of the embedded microsensors, a PdCr thin film strain gauge array that is suitable for in situ measuring of temperatures and strains in manufacturing processes was designed and fabricated for testing in the vertical end milling process. Time- and spatial-resolved signals were obtained during the milling process. The signals were decomposed to a static part, which apparently resulted from temperature changes, and the dynamic part, which resulted from dynamic strains induced by material removal during cutting. The milling tests demonstrated the ability of using this method to measure real-time temperatures and strains within the workpiece, which will be very valuable to the fundamental understanding of various manufacturing processes. It can also be used for bench marking numerical modeling and simulations.
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e-mail: xcli@engr.wisc.edu
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December 2008
Research Papers
Development of Metal Embedded Microsensors by Diffusion Bonding and Testing in Milling Process
Xudong Cheng,
Xudong Cheng
Department of Mechanical Engineering,
University of Wisconsin-Madison
, 1513 University Avenue, Madison, WI 53706
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Xiaochun Li
Xiaochun Li
Department of Mechanical Engineering,
e-mail: xcli@engr.wisc.edu
University of Wisconsin-Madison
, 1513 University Avenue, Madison, WI 53706
Search for other works by this author on:
Xudong Cheng
Department of Mechanical Engineering,
University of Wisconsin-Madison
, 1513 University Avenue, Madison, WI 53706
Xiaochun Li
Department of Mechanical Engineering,
University of Wisconsin-Madison
, 1513 University Avenue, Madison, WI 53706e-mail: xcli@engr.wisc.edu
J. Manuf. Sci. Eng. Dec 2008, 130(6): 061010 (9 pages)
Published Online: November 4, 2008
Article history
Received:
August 30, 2007
Revised:
August 12, 2008
Published:
November 4, 2008
Citation
Cheng, X., and Li, X. (November 4, 2008). "Development of Metal Embedded Microsensors by Diffusion Bonding and Testing in Milling Process." ASME. J. Manuf. Sci. Eng. December 2008; 130(6): 061010. https://doi.org/10.1115/1.3006318
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