..., extensive elastic deformation could be seen away from this region. 28 10 2010 11 10 2011 21 12 2011 21 12 2011 atomic force microscopy beams (structures) bending strength cracks densification density elasticity elongation forming processes metal foams porous...

... and atomic force microscopy. The role of microstructure and composition in altering both the mechanical and shape memory properties of the films is discussed. In addition to changes between the shape memory and superelastic responses, adjustment of phase transformation temperatures can cause complete loss...

...Michael Chandross; Christian D. Lorenz; Mark J. Stevens; Gary S. Grest Nanofabrication using arrays of modified atomic force microscopy (AFM) tips can drastically reduce feature sizes and increase data storage densities. Additionally, AFM experiments are valuable tools for characterizing...

... Compensation for Automatic Nanomanipulation With Scanning Probe Microscopes ,” IEEE. Trans. Autom. Sci. Eng. 1545-5955 , 3 ( 3 ), pp. 199 – 207 . 10.1109/TASE.2006.875534 Zheng , J. , Chen , Z. , and Liu , Z. , 2000 , “ Atomic Force Microscopy-Based Nanolithography on Silicon Using...

... cantilever. 18 02 2009 21 01 2010 26 05 2010 26 05 2010 atomic force microscopy cutting tools geometry micromachining wear Grooves with submicron depths can be scribed in materials including Al, Au–Pd, SiO 2 , Ni, and Si using conventional atomic force...

...F. Marinello; S. Carmignato; A. Voltan; E. Savio; L. De Chiffre This paper aimed at identifying the error sources that occur in dimensional measurements performed using atomic force microscopy. In particular, a set of characterization techniques for errors quantification is presented...

... for the fabrication of nanostructured components in polymer that relies on a simple and cost-effective master making technology. In particular, atomic force microscopy scratching is employed as an alternative technique for nanostructuring replication masters for microinjection molding. The conducted experimental...

...Santiago D. Solares; Gaurav Chawla We present an overview of four types of imaging artifacts that can occur during characterization of sharp sample topographies with intermittent contact atomic force microscopy (AFM) when using short nanotube probes ( < 100 nm in length). We discuss the causes...

... source and an integrated atomic force microscopy (AFM) probe tip, has been developed to improve the current plasma apparatus design. The miniature microwave plasma discharge applicator is capable of creating a miniature plasma stream with a diameter ranging from 2 mm down to micrometers. Hence...

.... However, the cutting depth in these investigations was in the range of several nanometers owing to the low lever stiffness. Machining in the range of several hundreds of nanometers has not been investigated. 02 03 2005 23 11 2005 nanotechnology machining atomic force microscopy...

...Jeong Woo Park; Noritaka Kawasegi; Noboru Morita; Deug Woo Lee The TNL (Tribo Nanolithography) method in aqueous solution uses the atomic force microscopy as a machining tool for the nanoscale fabrication of silicon. A specially designed cantilever with a diamond tip allows the formation of oxide...

.... The ablation products, swept away by an argon flow and collected in the distilled water, were further purified to result in a yield of 50%. The growth rate of purified aggregate ranged from 0.5 to 2 g ∕ h depending on the laser power. Microscopic scanning electron microscopy, atomic force microscopy...

... December 2000 01 March 2002 15 04 2003 atomic force microscopy Young's modulus indentation grinding etching manufacturing processes It is shown that the white etching layer sometimes generated on steel surfaces has a hardness of 12.9 ± 0.8 GPa , which is higher than...

... by the direct-writing mode. Scanning electron and atomic force microscopy analysis revealed that the holes are in the range 0.65–100 μm and are free from taper. In addition, there was little recast layer around the holes. The damage threshold was approximately 4 J/cm 2 , which is smaller than those obtained...