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Keywords: statistical process control
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Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Manuf. Sci. Eng. April 2012, 134(2): 021007.
Published Online: April 4, 2012
... such as statistical process control SPC, functional dimensioning and tolerancing, statistical tolerancing [( 2 )], and capability indices [( 3 )] have been developed to ease the designer’s task in estimating the possible geometrical variations of an assembly and, at the same time, obtain more robust control...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Manuf. Sci. Eng. April 2010, 132(2): 021010.
Published Online: April 1, 2010
... state space. The proposed MHMM is combined with statistical process control to quickly detect the occurrence of an unknown fault. This method allows the state space of a hidden Markov model to be adjusted and updated with the identification of new states. Hence, the online degradation assessment...
Journal Articles
Publisher: ASME
Article Type: Technical Briefs
J. Manuf. Sci. Eng. October 2008, 130(5): 054502.
Published Online: September 11, 2008
...A. D. Spence; D. W. Capson; M. P. Sklad; H.-L. Chan; J. P. Mitchell The need to simultaneously measure sheet metal geometry and strain arises during research, die tryout, statistical process control production part approval, or in response to manufacturing exceptions. Several optical systems have...
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Manuf. Sci. Eng. June 2007, 129(3): 644–652.
Published Online: November 13, 2006
...Hui Wang; Qiang Huang Traditional statistical process control (SPC) has been widely employed for the process monitoring in discrete part manufacturing. However, SPC does not consider any adjustment preventing the process drift. Furthermore, many in-line adjustment approaches, such as thermal error...
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Manuf. Sci. Eng. February 2006, 128(1): 315–325.
Published Online: December 15, 2004
...Jionghua Jin; Huairui Guo; Shiyu Zhou This paper presents a supervisory generalized predictive control (GPC) by combining GPC with statistical process control (SPC) for the control of the thin film deposition process. In the supervised GPC, the deposition process is described as an ARMAX model...