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Proc. ASME. IDETC-CIE2014, Volume 4: 19th Design for Manufacturing and the Life Cycle Conference; 8th International Conference on Micro- and Nanosystems, V004T09A032, August 17–20, 2014

Paper No: DETC2014-35479

DOI: https://doi.org/10.1115/DETC2014-35479

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Topics: Excitation, Atomic force microscopy, Cantilevers, Electromagnets, Experimental methods, Signals

Proceedings Papers

Spectral-Domain Based Impact Force Identification for Rod Structures

Pooya Ghaderi, Steven I. Rich, Andrew J. Dick

Proc. ASME. IMECE2013, Volume 4A: Dynamics, Vibration and Control, V04AT04A061, November 15–21, 2013

Paper No: IMECE2013-64892

DOI: https://doi.org/10.1115/IMECE2013-64892

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Topics: Finite element methods, Finite element model

Proceedings Papers

Transient Wave Propagation in a Materially Nonlinear Beam

Yu Liu, Andrew J. Dick

Proc. ASME. IMECE2013, Volume 4B: Dynamics, Vibration and Control, V04BT04A022, November 15–21, 2013

Paper No: IMECE2013-64975

DOI: https://doi.org/10.1115/IMECE2013-64975

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Topics: Transients (Dynamics), Wave propagation, Finite element methods, Computer simulation, Equations of motion, Waves

Proceedings Papers

Modeling Energy Dissipation in Atomic Force Microscopy

Wei Huang, Andrew J. Dick

Proc. ASME. IDETC-CIE2013, Volume 1: 15th International Conference on Advanced Vehicle Technologies; 10th International Conference on Design Education; 7th International Conference on Micro- and Nanosystems, V001T09A016, August 4–7, 2013

Paper No: DETC2013-13448

DOI: https://doi.org/10.1115/DETC2013-13448

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Topics: Atomic force microscopy, Energy dissipation, Modeling, Computer simulation, Damping, Excitation, Nanoscale phenomena, Resolution (Optics), Resonance, Simulation results

Proceedings Papers

High Fidelity Methods for Modeling Nonlinear Wave Propagation in One-Dimensional Waveguides

Yu Liu, Pooya Ghaderi, Andrew J. Dick

Proc. ASME. IMECE2012, Volume 4: Dynamics, Control and Uncertainty, Parts A and B, 741-750, November 9–15, 2012

Paper No: IMECE2012-88162

DOI: https://doi.org/10.1115/IMECE2012-88162

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Topics: Constitutive equations, Finite element methods, Gauge invariance, Modeling, Nonlinear waves, Numerical analysis, Shapes, Wave propagation, Waveguides

Proceedings Papers

Using a Semi-Active Tuned Mass Damper to Limit the Motion of a Nonlinear Absorber and Attenuate Structural Vibrations

R. Parker Eason, Chao Sun, Andrew J. Dick, Satish Nagarajaiah

Proc. ASME. IMECE2012, Volume 4: Dynamics, Control and Uncertainty, Parts A and B, 1315-1321, November 9–15, 2012

Paper No: IMECE2012-88068

DOI: https://doi.org/10.1115/IMECE2012-88068

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Topics: Dampers, Vibration, Hardening, Resonance, Stiffness

Proceedings Papers

Influence of Excitation Conditions in Dual-Frequency Tapping-Mode Atomic Force Microscopy

Andrew J. Dick, Wei Huang

Proc. ASME. IDETC-CIE2012, Volume 5: 6th International Conference on Micro- and Nanosystems; 17th Design for Manufacturing and the Life Cycle Conference, 335-343, August 12–15, 2012

Paper No: DETC2012-71404

DOI: https://doi.org/10.1115/DETC2012-71404

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Topics: Atomic force microscopy, Excitation, Probes, Approximation, Imaging

Proceedings Papers

Bifurcation Characteristics of an Impacted Cantilevered Beam for Off-Resonance Excitation

Andrew J. Dick

Proc. ASME. IMECE2011, Volume 7: Dynamic Systems and Control; Mechatronics and Intelligent Machines, Parts A and B, 831-839, November 11–17, 2011

Paper No: IMECE2011-65356

DOI: https://doi.org/10.1115/IMECE2011-65356

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Topics: Bifurcation, Excitation, Resonance, Approximation, Collisions (Physics), Damping, Modeling, Numerical analysis, Stiffness

Journal Articles

Parametric Resonance Based Piezoelectric Micro-Scale Resonators: Modeling and Theoretical Analysis

Pooya Ghaderi, Andrew J. Dick

J. Comput. Nonlinear Dynam. January 2013, 8(1): 011004.

Paper No: CND-11-1106

DOI: https://doi.org/10.1115/1.4006429

Published Online: June 14, 2012

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Topics: Damping, Equations of motion, Excitation, Frequency response, Microscale devices, Modeling, Oscillations, Resonance, Vibration, Theoretical analysis

Proceedings Papers

Parametric Resonance Based Piezoelectric Micro-Scale Resonators: Modeling and Theoretical Analysis

Pooya Ghaderi, Andrew J. Dick

Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 125-134, August 28–31, 2011

Paper No: DETC2011-47506

DOI: https://doi.org/10.1115/DETC2011-47506

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Topics: Microscale devices, Modeling, Resonance, Theoretical analysis, Oscillations, Computer simulation, Degrees of freedom, Excitation, Excitation systems, Signals

Proceedings Papers

Measuring Effective Modulus With Bifurcation Based Atomic Force Microscope Method

Wei Huang, Andrew J. Dick

Paper No: DETC2011-47503

DOI: https://doi.org/10.1115/DETC2011-47503

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Topics: Atomic force microscopy, Bifurcation, Control equipment, Probes, Accuracy and precision, Cantilevers, Design, Dynamics (Mechanics), Materials properties, Microscale devices

Journal Articles

Response Measurement Accuracy for Off-Resonance Excitation in Atomic Force Microscopy

R. Parker Eason, Andrew J. Dick

J. Dyn. Sys., Meas., Control. January 2012, 134(1): 011010.

DOI: https://doi.org/10.1115/1.4005361

Published Online: December 5, 2011

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Topics: Accuracy and precision, Atomic force microscopy, Displacement, Errors, Excitation, Probes, Resonance, Calibration, Lasers, Displacement measurement

Journal Articles

Influence of Local Material Properties on the Nonlinear Dynamic Behavior of an Atomic Force Microscope Probe

Wei Huang, Andrew J. Dick

J. Comput. Nonlinear Dynam. October 2011, 6(4): 041009.

DOI: https://doi.org/10.1115/1.4003732

Published Online: April 14, 2011

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Topics: Atomic force microscopy, Bifurcation, Cantilevers, Excitation, Probes, Separation (Technology), Simulation, Materials properties, Stiffness

Proceedings Papers

Localized Material Properties Through Nonlinear Dynamics Based Atomic Force Microscopy

Wei Huang, Andrew J. Dick

Proc. ASME. IDETC-CIE2010, Volume 4: 12th International Conference on Advanced Vehicle and Tire Technologies; 4th International Conference on Micro- and Nanosystems, 507-516, August 15–18, 2010

Paper No: DETC2010-29022

DOI: https://doi.org/10.1115/DETC2010-29022

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Topics: Atomic force microscopy, Materials properties, Nonlinear dynamics, Probes, Bifurcation, Excitation, Resonance, Separation (Technology), Simulation results

Proceedings Papers

Response Measurement Accuracy for Off-Resonance Excitation in Atomic Force Microscopy

Andrew J. Dick, R. Parker Eason

Proc. ASME. IDETC-CIE2010, Volume 4: 12th International Conference on Advanced Vehicle and Tire Technologies; 4th International Conference on Micro- and Nanosystems, 517-524, August 15–18, 2010

Paper No: DETC2010-29029

DOI: https://doi.org/10.1115/DETC2010-29029

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Topics: Accuracy and precision, Atomic force microscopy, Excitation, Resonance, Calibration, Displacement, Damping, Laser beams, Lasers, Nanoscale phenomena

Journal citation

NARROW

Analytical Investigation of Vibration Attenuation With a Nonlinear Tuned Mass Damper

Alternating Frequency–Time Finite Element Method: High-Fidelity Modeling of Nonlinear Wave Propagation in One-Dimensional Waveguides

Numerical Analysis of Transient Wave Propagation in Nonlinear One-Dimensional Waveguides by Using the Spectral Finite Element Method

Numerical Investigation of Lateral and Axial Wave Propagation in Drill-Strings for Stability Monitoring

Numerical Analysis of Lateral Wave Propagation in Drill-String for Stability Monitoring

Investigation of Dual-Frequency Excitation and the Influence of Excitation Phase on a Constrained Cantilevered Beam System

Spectral-Domain Based Impact Force Identification for Rod Structures

Transient Wave Propagation in a Materially Nonlinear Beam

Modeling Energy Dissipation in Atomic Force Microscopy

High Fidelity Methods for Modeling Nonlinear Wave Propagation in One-Dimensional Waveguides

Using a Semi-Active Tuned Mass Damper to Limit the Motion of a Nonlinear Absorber and Attenuate Structural Vibrations

Influence of Excitation Conditions in Dual-Frequency Tapping-Mode Atomic Force Microscopy

Bifurcation Characteristics of an Impacted Cantilevered Beam for Off-Resonance Excitation

Parametric Resonance Based Piezoelectric Micro-Scale Resonators: Modeling and Theoretical Analysis

Parametric Resonance Based Piezoelectric Micro-Scale Resonators: Modeling and Theoretical Analysis

Measuring Effective Modulus With Bifurcation Based Atomic Force Microscope Method

Response Measurement Accuracy for Off-Resonance Excitation in Atomic Force Microscopy

Influence of Local Material Properties on the Nonlinear Dynamic Behavior of an Atomic Force Microscope Probe

Localized Material Properties Through Nonlinear Dynamics Based Atomic Force Microscopy

Response Measurement Accuracy for Off-Resonance Excitation in Atomic Force Microscopy

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