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Proceedings Papers

A Generalized Self-Consistent Method for Osteonal Cortical Bone Modeling

X. Edward Guo, X. Neil Dong, Y. Young Huang
Proc. ASME. IMECE98, Advances in Bioengineering, 271-272, November 15–20, 1998
Publisher: American Society of Mechanical Engineers
Paper No: IMECE1998-0135
https://doi.org/10.1115/IMECE1998-0135
View Paper titled, A Generalized Self-Consistent Method for Osteonal Cortical Bone Modeling
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Topics: Bone, Modeling, Composite materials, Fibers, Damage mechanics, Mechanical properties, Microcracks, Bone mechanics, Elasticity, Fracture mechanics
Proceedings Papers

Transversely Isotropic Model of Osteonal Cortical Bone: Contribution of Haversian and Resorptive Porosity

X. Neil Dong, Y. Young Huang, X. Edward Guo
Proc. ASME. IMECE99, Advances in Bioengineering, 183-184, November 14–19, 1999
Publisher: American Society of Mechanical Engineers
Paper No: IMECE1999-0438
https://doi.org/10.1115/IMECE1999-0438
View Paper titled, Transversely Isotropic Model of Osteonal Cortical Bone: Contribution of Haversian and Resorptive Porosity
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Topics: Bone, Porosity, Canals, Cavities
Journal Articles

A Comparison of X-Ray Microdiffraction and Coherent Gradient Sensing in Measuring Discontinuous Curvatures in Thin Film: Substrate Systems

Michal A. Brown, Tae-Soon Park, Ares Rosakis, Ersan Ustundag, Young Huang, Nobumichi Tamura, Bryan Valek
Journal: Journal of Applied Mechanics
Publisher: ASME
Article Type: Technical Papers
J. Appl. Mech. September 2006, 73(5): 723–729.
https://doi.org/10.1115/1.2150500
Published Online: October 14, 2005
View Article titled, A Comparison of X-Ray Microdiffraction and Coherent Gradient Sensing in Measuring Discontinuous Curvatures in Thin Film: Substrate Systems
Open the PDF for A Comparison of X-Ray Microdiffraction and Coherent Gradient Sensing in Measuring Discontinuous Curvatures in Thin Film: Substrate Systems in another window
Topics: Deformation, Semiconductor wafers, Stress, Thin films, X-ray diffraction